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Investigation of thermal properties of thyristor structures based on genetic algorithm / Robert Arsoba, Zbigniew Suszyński.

Autor: Współtwórca(-y): Rodzaj materiału: ArtykułTematy: Rodzaj/forma: W: ICSES'2002 : proceedings of the International Conference on Signals and Electronic Systems, Wrocław - Świeradów Zdrój, Poland, 24-27 September 2002 / ed. by R. Makowski. - Wrocław : Wrocławskie Towarzystwo Naukowe, 2002Streszczenie: In this paper, novel approach to determination of thermal properties of multilayer structures, such as thyristor ones is presented. The method is based on genetic algorithm and analysis of amplitude and phase contrast characteristics in frequency domain. One-dimensional thermal modelling was used in computations. Measurements were carried out using photoacoustic method. Preliminary experimental results for three-layered thyristor structure are presented. Satisfactory accuracy of thermal properties determined by genetic algorithm was obtained.
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Sprawozdanie jednostki (Informator o publikowanych wynikach prac naukowo-badawczych w 2002 roku Wydziału Elektroniki).

In this paper, novel approach to determination of thermal properties of multilayer structures, such as thyristor ones is presented. The method is based on genetic algorithm and analysis of amplitude and phase contrast characteristics in frequency domain. One-dimensional thermal modelling was used in computations. Measurements were carried out using photoacoustic method. Preliminary experimental results for three-layered thyristor structure are presented. Satisfactory accuracy of thermal properties determined by genetic algorithm was obtained.

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