Dane z Informatora o publikowanych wynikach prac naukowo-badawczych w 2002 roku Wydziału Elektroniki.

The paper presents non-destructive method of investigation of multilayer structures containing conducting, material, such as thyristor structures. The proposed method is based on induction heating of examined object and infrared detection of temperature field. Infrared images of examined thyristor structures registered with the help of this method are presented. Short discussion of advantages and disadvantages of the method is also included. It was found that obtained images require image processing to retrieve information about internal defects of examined object. Applied algorithms ensure satisfactory quality of images. This quality is sufficient to determine areas with defects. The main benefit from usage of the proposed method is extremely short time of registration. Therefore, this method can be applied in industry for quality assessment of thyristor structures. Obtained preliminary results confirm usability of the method.