Investigation on transient thermal characteristics of microwave transistors / Włodzimierz Janke, Jarosław Kraśniewski.
Rodzaj materiału:
ArtykułJęzyk: pol eng Szczegóły wydania: 2009.
W: Metrology And Measurement Systems. - Vol. 16, 2009, Nr 3, s. 433-442Streszczenie: The transient thermal characteristics of modern microwave transistors may strongly infuence the performance of many microwave cicuits. In the paper, the method and the exemplary results of measurements of transient thermal impedance of microwave transistors are presented. Special attention is devoted to measurements in very short time periods after step chenge of power. The presented results are not available in typical datasheets of microwave transistors. Apart from measurements, an analytical approximation of thermal impedance is presented and the exemplary sets of its parameters obtained by curve fitting.
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Dane z autopsji.
The transient thermal characteristics of modern microwave transistors may strongly infuence the performance of many microwave cicuits. In the paper, the method and the exemplary results of measurements of transient thermal impedance of microwave transistors are presented. Special attention is devoted to measurements in very short time periods after step chenge of power. The presented results are not available in typical datasheets of microwave transistors. Apart from measurements, an analytical approximation of thermal impedance is presented and the exemplary sets of its parameters obtained by curve fitting.