Machine vision - a novel quality in monitoring systems / Anna Zawada-Tomkiewicz, Borys Storch, Izabela Wierucka.
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ArtykułJęzyk: angielski
W: Machine Engineering / pod red. Jerzy Jędrzejewski. - Wrocław : Agenda Wydawnicza Wrocławskiej Rady FSNT NOT. - 2003, Vol. 3, nr 1-2, s. 242-248Streszczenie: When digital computers became available, they started to be used to process and extract information from digitized images. Work on digital image analysis dealt with specific classes of images - machined surface images. This paper is concerned with the problem of measurements of machined surface using a computer vision system. The paper is divided into two parts. Firstly, an overview of machine vision in general is given. Secondly, the machined surface monitoring system via its digital image analysis is explained.
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Maszynopis.
When digital computers became available, they started to be used to process and extract information from digitized images. Work on digital image analysis dealt with specific classes of images - machined surface images. This paper is concerned with the problem of measurements of machined surface using a computer vision system. The paper is divided into two parts. Firstly, an overview of machine vision in general is given. Secondly, the machined surface monitoring system via its digital image analysis is explained.