Determination of thermal parameters of multilayer structure /
SUSZYŃSKI, Zbigniew. Politechnika Koszalińska - Wydział Elektroniki, Katedra Elektroniki Ciała Stałego 1996 - .
Determination of thermal parameters of multilayer structure / Zbigniew Suszyński, Piotr Majchrzak. - 2002.
sprawozdanie jednostki (Informator o publikowanych wynikach prac naukowo-badawczych w 2002 roku Wydziału Elektroniki).
In this paper, photothermal method of testing, namely Thermal Wave Microscopy (TWM) and neural network (nnet) are applied to determine thermal parameters in multilayer structure. One-dimensional thermal modelling is used to train the nnet. Amplitude and phase contrasts are used to eliminate transmittance of measurement setup. The values of thermal parameters obtained from nnet are applied in thermal model and compared with experimental results.
Materiały konferencyjne.
Determination of thermal parameters of multilayer structure / Zbigniew Suszyński, Piotr Majchrzak. - 2002.
sprawozdanie jednostki (Informator o publikowanych wynikach prac naukowo-badawczych w 2002 roku Wydziału Elektroniki).
In this paper, photothermal method of testing, namely Thermal Wave Microscopy (TWM) and neural network (nnet) are applied to determine thermal parameters in multilayer structure. One-dimensional thermal modelling is used to train the nnet. Amplitude and phase contrasts are used to eliminate transmittance of measurement setup. The values of thermal parameters obtained from nnet are applied in thermal model and compared with experimental results.
Materiały konferencyjne.