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Estimation of surface roughness parameter based on machined surface image / Anna Zawada-Tomkiewicz.

Autor: Rodzaj materiału: ArtykułArtykułJęzyk: angielski Tematy: W: Metrology and Measurement Systems. - 2010, Vol.17, nr 3, s. 493-503Streszczenie: The optical method suggested in this paper is based on the vision system created to acquire an image of the machined surface during the cutting process. The acquired image is analyzed to correlate ist parameters with surface parameters. In the application of machined surface image analysis, the wavelet methods were introduced. A digital image of a machined surface was described using the one-dimensional Digital Wavelet Transform with the basic wavelet as Coiflet. The statistical description of wavelet components made it possible to dwvelop the quality measure and correlate it with surface roughness.
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Dane z autopsji.

The optical method suggested in this paper is based on the vision system created to acquire an image of the machined surface during the cutting process. The acquired image is analyzed to correlate ist parameters with surface parameters. In the application of machined surface image analysis, the wavelet methods were introduced. A digital image of a machined surface was described using the one-dimensional Digital Wavelet Transform with the basic wavelet as Coiflet. The statistical description of wavelet components made it possible to dwvelop the quality measure and correlate it with surface roughness.

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