Surface roughness measurements by photometric method / Tadeusz Karpiński, Czesław Łukianowicz.
Rodzaj materiału:
ArtykułJęzyk: angielski Szczegóły wydania: 1977.
W: Annals of the CIRP. Manufacturing Technology. - 1977, Vol. 25/1, s. 371-374Streszczenie: In this paper the teoretical bases of the photometric method dealing with measuring of the surface roughness are presented. Equations have been elaborated deascribing dependences occuring between photometric values and the surface roughness, the equations characterizing radiation reflected from the examined surface.
| Typ dokumentu | Obecna biblioteka | Sygnatura | Status | Termin zwrotu | Kod kreskowy | |
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Artykuł
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Bibliografia Prac Pracowników - BPK | 01088 (Przeglądaj półkę(Otwórz poniżej)) | Nie można wypożyczyć |
Dane z autopsji.
In this paper the teoretical bases of the photometric method dealing with measuring of the surface roughness are presented. Equations have been elaborated deascribing dependences occuring between photometric values and the surface roughness, the equations characterizing radiation reflected from the examined surface.