TY  - GEN
AU  - SUSZYŃSKI,Zbigniew, Politechnika Koszalińska - Wydział Elektroniki
AU  - ARSOBA,Robert, Politechnika Koszalińska - Wydział Elektroniki
AU  - MAJCHRZAK,Piotr, Politechnika Koszalińska - Wydział Elektroniki
ED  - International Conference on Signals and Electronic Systems ICSES'2001
TI  - Photothermal diagnostics of high-power thyristor
KW  - Tyrystory
KW  - Materiały konferencyjne
N1  - Dane z Informatora o publikowanych wynikach prac naukowo-badawczych w 2001 roku Wydziału Elektroniki
N2  - In this paper possibilities of quality adhesion assessment between silicon and molybdenum layers in powere thyristors are presented. For the structure diagnostic, the photothermal method was used. Amplitude and phase photothermal images show the same areas of delamination as the pictures from scanning acoustic microscope. In the contrary to the acoustic method, the photothermal one is non-contact and does not require the sample to be immersed in the coupling fluid. Three-layered thyristor structure are presented. Satisfactory accuracy of thermal properties determined by genetic algorithm was obtained
ER  -