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  <titleInfo>
    <title>Infrared investigation of thyristor structures using induction heating</title>
  </titleInfo>
  <name type="personal">
    <namePart>SUSZYŃSKI, Zbigniew.</namePart>
    <namePart type="termsOfAddress">Politechnika Koszalińska - Wydział Elektroniki, Katedra Elektroniki Ciała Stałego</namePart>
    <namePart type="date">1996 -</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <name type="personal">
    <namePart>ARSOBA, Robert.</namePart>
    <namePart type="termsOfAddress">Politechnika Koszalińska - Wydział Elektroniki, Katedra Inżynierii Komputerowej</namePart>
    <namePart type="date">1996 -</namePart>
  </name>
  <name type="conference">
    <namePart>MIXDES'2002 2002 ; Wrocław, Polska).</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <genre authority="marc">conference publication</genre>
  <genre authority="">Materiały konferencyjne.</genre>
  <originInfo>
    <place>
      <placeTerm type="code" authority="marccountry">pl</placeTerm>
    </place>
    <dateIssued encoding="marc">2002</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <language>
    <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
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  <abstract>The paper presents non-destructive method of investigation of multilayer structures containing conducting, material, such as thyristor structures. The proposed method is based on induction heating of examined object and infrared detection of temperature field. Infrared images of examined thyristor structures registered with the help of this method are presented. Short discussion of advantages and disadvantages of the method is also included. It was found that obtained images require image processing to retrieve information about internal defects of examined object. Applied algorithms ensure satisfactory quality of images. This quality is sufficient to determine areas with defects. The main benefit from usage of the proposed method is extremely short time of registration. Therefore, this method can be applied in industry for quality assessment of thyristor structures. Obtained preliminary results confirm usability of the method.</abstract>
  <targetAudience authority="marctarget">specialized</targetAudience>
  <note type="statement of responsibility">Z. Suszyński, R. Arsoba, A. Napieralski, W. Tylman.</note>
  <note>Dane z Informatora o publikowanych wynikach prac naukowo-badawczych w 2002 roku Wydziału Elektroniki.</note>
  <subject authority="lcsh">
    <topic>Tyrystory</topic>
  </subject>
  <classification authority="udc">621.392.3</classification>
  <relatedItem type="host" displayLabel="W :">
    <titleInfo>
      <title>IX International Conference Mixed Design. -</title>
    </titleInfo>
    <part>
      <text>2002, s. 381-384</text>
    </part>
  </relatedItem>
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    <recordCreationDate encoding="marc">151102</recordCreationDate>
    <recordChangeDate encoding="iso8601">20180427091000.0</recordChangeDate>
    <recordIdentifier source="KOSZ 005">32</recordIdentifier>
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