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    <subfield code="a">SUSZY&#x143;SKI, Zbigniew.</subfield>
    <subfield code="d">1996 - .</subfield>
    <subfield code="b">Politechnika Koszali&#x144;ska - Wydzia&#x142; Elektroniki,</subfield>
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    <subfield code="a">Thermal diagnostic of power thyristor /</subfield>
    <subfield code="c">Zbigniew Suszy&#x144;ski, Robert Arsoba, Piotr Majchrzak.</subfield>
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    <subfield code="a">In this paper a non-destructive photothermal method of testing, namely Thermal Wave Microscopy (TWM), is applied to assess the quality of adhesion between the silicon and molybdenum layers in power thyristor structures.</subfield>
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    <subfield code="d">2001 ;</subfield>
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    <subfield code="i">W :</subfield>
    <subfield code="t">International workshop on thermal investigations of ICs and systems : plus a special half-day on dynamic measurements : THERMINIC, Paris, France, 24-27 September 2001. -</subfield>
    <subfield code="d">Grenoble : TIMA, 2001. -</subfield>
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