000			02130naa a2200253 i 4500
001			BPP
003			BPK
005			20180316081153.0
008			151102s2001 pl a f |100 0 eng
040			_cBPK
041			_aeng
044			_aPOL
100			_aSUSZYŃSKI, Zbigniew. _d1996 - . _bPolitechnika Koszalińska - Wydział Elektroniki, _cKatedra Elektroniki Ciała Stałego
245			_aDetection of loss of air-tightness regions in power transistor by photoacoustic mathod / _cZbigniew Suszyński, Robert Arsoba, Piotr Majchrzak.
260			_c2001.
500			_aDane z Informatora o publikowanych wynikach prac naukowo-badawczych w 2001 roku Wydziału Elektroniki.
520			_aIn this paper opportunities of applying photoacoustic method to investigate the causes of loss of air-tightness in semiconductor devices are presented. Quality of joint of plastic with metal substrate in power transistors was examined. Images of transistor structures obtained with the help of photoacoustic microscope were interpreted basing on amplitude and phase frequency dependencies. In the consequence of analysing photoacoustic images the method for unambiguous recognition of delaminations, which are the cause of loss of air-tightness, was developed. This recognition can be carried out regardless of factors exerting influence on images such as geometrical changes and variations of physical parameters of examined object. The results obtained allow to optimise technological conditions of encapsulation process.
650		0	_aTranzystory.
700			_aARSOBA, Robert. _d1996 - . _bPolitechnika Koszalińska - Wydział Elektroniki, _cKatedra Inżynierii Komputerowej
700			_aMAJCHRZAK, Piotr. _d1998 - . _bPolitechnika Koszalińska - Wydział Elektroniki, _cKatedra Inżynierii Komputerowej
711			_aInternational Conference IMAPS-Poland 2001 _n(25 ; _d2001 ; _cRzeszów / Polańczyk, Polska). _pIMAPS - POLAND 2001
773			_iW : _t25 International Conference and Exhibition IMAPS–Poland 2001 : Rzeszów–Polańczyk 26–29 September 2001. - _dRzeszów, 2001. - _gs. 271-274
942			_cART _2UKD
999			_c181 _d181