000			01585naa a2200229 i 4500
001			271
003			KOSZ 005
005			20180201111354.0
008			151105s2006 pl f |100 0 eng
040			_cBPK _dKOSZ 005/EG
041			_aeng
044			_aPOL
100	1		_aMAJCHRZAK, Piotr. _d1998 - . _bPolitechnika Koszalińska - Wydział Elektroniki i Informatyki, _cKatedra Inżynierii Komputerowej
245	1	0	_aInvestigation of sensibility of thermal impedance on selected parameters of three-layered structure / _cPiotr Majchrzak, Zbigniew Suszyński.
500			_aDane z autopsji.
520			_aIn the paper a method of analysis of sensibility of layered structure thermal impedance for changing of selected parameters values was presented. The parameters analysed were quotient of thickness and square root of thermal diffusivity of selected layer and quotient of effusivities of adjoined layers. The TLM (Transmisja-Line Modeling) method was used for the valculations.
655		0	_aMateriały konferencyjne.
700	1		_aSUSZYŃSKI, Zbigniew. _d1996 - . _bPolitechnika Koszalińska - Wydział Elektroniki i Informatyki, _cKatedra Inżynierii Komputerowej
773	0		_iW : _tXXX International Conference IMAPS Poland Chapter 2006, Kraków, 24-27 September 2006 : proceedings / [ed. Wiesław Zaraska, Andrzej Cichocki, Dorota Szwagierczak]. - _dKraków : Institute of Electron Technology. Cracow Division, 2006. - _gs. 373-376
711	2	2	_aInternational Conference IMAPS-Poland 2006 _n(30 ; _d2006 ; _cKraków, Polska). _pIMAPS Poland 2006
942			_cROZ _2UKD
999			_c271 _d271