| 000 | 01542naa a2200241 i 4500 | ||
|---|---|---|---|
| 001 | BPP | ||
| 003 | BPK | ||
| 005 | 20180201140939.0 | ||
| 008 | 151105s2002 pl f |100 0 eng | ||
| 040 | _cBPK | ||
| 041 | _aeng | ||
| 044 | _aPOL | ||
| 100 |
_aSUSZYŃSKI, Zbigniew. _d1996 - . _bPolitechnika Koszalińska - Wydział Elektroniki, _cKatedra Elektroniki Ciała Stałego |
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| 245 |
_aDetermination of thermal parameters of multilayer structure / _cZbigniew Suszyński, Piotr Majchrzak. |
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| 260 | _c2002. | ||
| 500 | _asprawozdanie jednostki (Informator o publikowanych wynikach prac naukowo-badawczych w 2002 roku Wydziału Elektroniki). | ||
| 520 | _aIn this paper, photothermal method of testing, namely Thermal Wave Microscopy (TWM) and neural network (nnet) are applied to determine thermal parameters in multilayer structure. One-dimensional thermal modelling is used to train the nnet. Amplitude and phase contrasts are used to eliminate transmittance of measurement setup. The values of thermal parameters obtained from nnet are applied in thermal model and compared with experimental results. | ||
| 655 | 0 | _aMateriały konferencyjne. | |
| 700 |
_aMAJCHRZAK, Piotr. _d1998 - . _bPolitechnika Koszalińska - Wydział Elektroniki, _cKatedra Inżynierii Komputerowej |
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| 773 |
_iW : _tInternational Conference on Signals and Electronic Systems. - |
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| 711 |
_aInternational Conference on Signals and Electronic Systems ICSES 2002 _d(2002 ; _cWrocław / Świeradów Zdrój, Polska). _pICSES'2002 |
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| 942 | _cART | ||
| 999 |
_c31 _d31 |
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