Determination of thermal parameters of multilayer structure / Zbigniew Suszyński, Piotr Majchrzak.
Rodzaj materiału:
ArtykułJęzyk: angielski Szczegóły wydania: 2002.Rodzaj/forma:
W: International Conference on Signals and Electronic Systems. -Streszczenie: In this paper, photothermal method of testing, namely Thermal Wave Microscopy (TWM) and neural network (nnet) are applied to determine thermal parameters in multilayer structure. One-dimensional thermal modelling is used to train the nnet. Amplitude and phase contrasts are used to eliminate transmittance of measurement setup. The values of thermal parameters obtained from nnet are applied in thermal model and compared with experimental results.
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sprawozdanie jednostki (Informator o publikowanych wynikach prac naukowo-badawczych w 2002 roku Wydziału Elektroniki).
In this paper, photothermal method of testing, namely Thermal Wave Microscopy (TWM) and neural network (nnet) are applied to determine thermal parameters in multilayer structure. One-dimensional thermal modelling is used to train the nnet. Amplitude and phase contrasts are used to eliminate transmittance of measurement setup. The values of thermal parameters obtained from nnet are applied in thermal model and compared with experimental results.